The impact of radiation-induced failure mechanisms in electronic components on system reliability

被引：6
|
作者：
Mayer, Donald C. [1 ]
Koga, Rokutaro [1 ]
Womack, James M. [1 ]
机构：
[1] Aerosp Corp, El Segundo, CA 90245 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2007年 / 54卷 / 06期
关键词：
destructive radiation effects; reliability; single-event burnout; single-event effects; single-event latchup;
D O I：
10.1109/TNS.2007.910294
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A methodology is described to incorporate destructive radiation effects into the reliability estimation for a space system. Examples are presented to illustrate how on-orbit system reliability can be estimated from test data from radiation-sensitive parts.
引用
收藏
页码：2120 / 2124
页数：5
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