Local elasticity measurement on polymers using atomic force microscopy

被引：42
|
作者：
Nie, HY
Motomatsu, M
Mizutani, W
Tokumoto, H
机构：
[1] NATL INST ADV INTERDISCIPLINARY RES,JOINT RES CTR ATOM TECHNOL,TSUKUBA,IBARAKI 305,JAPAN
[2] ANGSTROM TECHNOL PARTNERSHIP,JOINT RES CTR ATOM TECHNOL,TSUKUBA,IBARAKI 305,JAPAN
来源：
THIN SOLID FILMS | 1996年 / 273卷 / 1-2期
关键词：
atomic force microscopy; polymers; electrical properties and measurements; surface morphology;
D O I：
10.1016/0040-6090(95)06807-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Local elasticity was measured on polymers by modifying atomic force microscopy (AFM) in which the sample height was modulated and the response of the cantilever was detected. Tn a case of polystyrene (PS) on mica, there existed many circular holes in the film that were stiffer than the rest parts. The holes were identified as the substrate mica surface and the rest as PS films. In the case of a polyethyleneoxide surface on mica, a crystalline nature was observed. In addition, the surface was modified by scanning an AFM tip at large forces of 20 nN. The scanned area exhibited an increase in elasticity as well as formation of a striped structure.
引用
收藏
页码：143 / 148
页数：6
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