Dielectric Characterization at Millimeter Waves With Hybrid Microstrip-Line Method

被引:21
|
作者
Lin, Xiaoyou [1 ]
Seet, Boon-Chong [1 ]
机构
[1] Auckland Univ Technol, Dept Elect & Elect Engn, Auckland 1010, New Zealand
关键词
Dielectric characterization; millimeter waves (mm-waves); transmission/reflection (T/R) method; ANTENNAS; PERMITTIVITY; DESIGN;
D O I
10.1109/TIM.2017.2746362
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a hybrid microstrip-line method for characterizing materials with unknown dielectric properties at millimeter-wave (mm-Wave) frequencies. The proposed method introduces two error boxes, representing the impedance mismatch and discontinuities caused by signal path transitions between two different types of transmission lines. Therefore, unlike conventional coveredor two-transmission-line methods, the proposed method requires neither a perfect impedance match between the test fixture and the coaxial cables nor a high reproducibility of the transitions' radio frequency characteristics. We applied the proposed method to characterize two types of dielectric materials: Rogers RT/d5880 standard high-frequency substrate and a plain-woven polyester fabric substrate, using a single setup with an in-house designed universal test fixture in the 37-39 GHz range. The accuracy of the proposed method under imperfect fixture conditions is demonstrated.
引用
收藏
页码:3100 / 3102
页数:3
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