High-speed Mueller matrix ellipsometer with microsecond temporal resolution

被引:29
|
作者
Zhang, Song [1 ]
Jiang, Hao [1 ]
Gu, Honggang [1 ]
Chen, Xiuguo [1 ]
Liu, Shiyuan [1 ]
机构
[1] Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China
来源
OPTICS EXPRESS | 2020年 / 28卷 / 08期
基金
中国国家自然科学基金;
关键词
4 PHOTOELASTIC MODULATORS; PEAK RETARDATION; CALIBRATION; POLARIMETER; ANGLE;
D O I
10.1364/OE.389825
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A high-speed Mueller matrix ellipsometer (MME) based on photoelastic modulator (PEM) polarization modulation and division-of-amplitude polarization demodulation has been developed, with which a temporal resolution of 11 mu s has been achieved for a Mueller matrix measurement. To ensure the accuracy and stability, a novel approach combining a fast Fourier transform algorithm and Bessel function expansion is proposed for the in-situ calibration of PEM. With the proposed calibration method, the peak retardance and static retardance of the PEM can be calibrated with high accuracy and sensitivity over an ultra large retardance variation range. Both static and dynamic measurement experiments have been carried out to show the high accuracy and stability of the developed MME, which can be expected to pave the way for in-situ and real-time monitoring for rapid reaction processes. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:10873 / 10887
页数:15
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