IDENTIFYING BOUNDARY STRUCTURES BY X-RAY DIFFRACTION

被引：0

作者：

Ungar, Tumas ^{[1
]}

Pantleon, Wolfgang ^{[1
]}

机构：

[1] Eotvos Lorand Univ, Dept Mat Phys, H-1117 Budapest, Hungary

来源：

NANOSTRUCTURED METALS: FUNDAMENTALS TO APPLICATIONS | 2009年

关键词：

PLASTIC-DEFORMATION; CRYSTALLITE SIZE; METALS; MICROSTRUCTURE; SUBGRAINS; FAULTS;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

X-ray diffraction is a versatile tool for characterizing microstructures of different kind non-destructively. Two recent developments for resolving deformation-induced boundary structures are discussed. Elaborated X-ray line profile analysis allows separating different microstructural features as grain size, microstrains (caused by dislocations) and twinning due to their different effects on functional shape, diffraction order and hkl dependence of radial peak profiles. High angular resolution three-dimensional X-ray diffraction enables tracing of individual subgrains in a polycrystalline specimen and following their dynamics in-situ during loading.

引用

页码：157 / 170

页数：14

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