IDENTIFYING BOUNDARY STRUCTURES BY X-RAY DIFFRACTION

X-ray diffraction is a versatile tool for characterizing microstructures of different kind non-destructively. Two recent developments for resolving deformation-induced boundary structures are discussed. Elaborated X-ray line profile analysis allows separating different microstructural features as grain size, microstrains (caused by dislocations) and twinning due to their different effects on functional shape, diffraction order and hkl dependence of radial peak profiles. High angular resolution three-dimensional X-ray diffraction enables tracing of individual subgrains in a polycrystalline specimen and following their dynamics in-situ during loading.