Reporting statistical uncertainty of certified values for reference materials

被引：0
|
作者：
Obenauf, RH [1 ]
Kocherlakota, N [1 ]
机构：
[1] SPEX CertiPrep, Metuchen, NJ 08840 USA
来源：
SPECTROSCOPY | 2005年
关键词：
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：26 / 28
页数：3
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