Reporting statistical uncertainty of certified values for reference materials

被引：0

作者：

Obenauf, RH ^{[1
]}

Kocherlakota, N ^{[1
]}

机构：

[1] SPEX CertiPrep, Metuchen, NJ 08840 USA

来源：

SPECTROSCOPY | 2005年

关键词：

D O I：

暂无

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：26 / 28

页数：3

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