Materials discovery via topologically-correct display of reduced-dimension data

Authors describe and demonstrate a 'ratio-conserving' mapping procedure for attaining reduced-dimension representations of multidimensional data. This procedure has a theoretical basis for topological correctness in that the ratio of the metrics in the two representations is maintained constant throughout. It is also demonstrated that comparing the reduced-dimension depiction of data with the results of clustering and spanning tree operations in the full-dimension space can validate such reduced-dimension mappings. Demonstrations are carried out using a body of semiconductor data, with five independent variables and one dependent variable. (C) 1998 Published by Elsevier Science S.A. All rights reserved.