We investigated the carrier injection properties in small molecular organic light emitting devices with a mixed single layer by measuring current-voltage characteristics using Au/MoO3 as hole and Al alloy as electron injection electrodes. The carrier injection mechanism at the interface was primarily ascribed to the Schottky thermionic emission with the barrier height of 0.25 eV for holes and 0.67 eV for electrons. It was found that the barrier height of the electron was dependent on LUMO level of electron transport material. In addition, the interfacial state analysis demonstrated that the electron barrier height was also dependent on the interfacial conditions of the devices. (C) 2010 Elsevier B. V. All rights reserved.
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Kwangwoon Univ, Dept Electrophys, Seoul 139701, South KoreaKwangwoon Univ, Dept Electrophys, Seoul 139701, South Korea
Park, Byoungchoo
Huh, Yoon Ho
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Kwangwoon Univ, Dept Electrophys, Seoul 139701, South KoreaKwangwoon Univ, Dept Electrophys, Seoul 139701, South Korea
Huh, Yoon Ho
Jeon, Hong Goo
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Kwangwoon Univ, Dept Electrophys, Seoul 139701, South KoreaKwangwoon Univ, Dept Electrophys, Seoul 139701, South Korea
Jeon, Hong Goo
Park, Chan Huk
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Kwangwoon Univ, Dept Electrophys, Seoul 139701, South KoreaKwangwoon Univ, Dept Electrophys, Seoul 139701, South Korea
Park, Chan Huk
Kang, Tae Kyung
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Kwangwoon Univ, Dept Chem, Seoul 139701, South KoreaKwangwoon Univ, Dept Electrophys, Seoul 139701, South Korea
Kang, Tae Kyung
Kim, Byeong Hyo
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Kwangwoon Univ, Dept Chem, Seoul 139701, South KoreaKwangwoon Univ, Dept Electrophys, Seoul 139701, South Korea
Kim, Byeong Hyo
Park, Jongwoon
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Korea Inst Ind Technol, Natl Ctr Nanoproc & Equipment, Nanoelect Team, Kwangju 500480, South KoreaKwangwoon Univ, Dept Electrophys, Seoul 139701, South Korea