The time-frequency analysis approach of electric noise based on the wavelet transform

被引：18
|
作者：
Dai, YS [1 ]
机构：
[1] Jilin Univ Technol, Dept Elect Engn, Changchun 130025, Peoples R China
来源：
SOLID-STATE ELECTRONICS | 2000年 / 44卷 / 12期
关键词：
wavelet transform; time-frequency analysis; electric noise; noise spectrum; chaos;
D O I：
10.1016/S0038-1101(00)00163-5
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, the wavelet transform approach has been firstly introduced to analyze electric noise in a transistor. Due to the multiresolution ability of wavelet transform, we can separate noise signal into several detail signals and approximation signal which can be interpreted in terms of the noise output of a generalized constant-Q filter bank and low pass filter, respectively. Based on this approach, the fractal and chaos characteristic of 1/f noise are obtained, the smaller burst noise pulse embedded in the white noise and 1/f noise can be detected, and the noise spectrum can also be calculated from short noise data. These results demonstrate that wavelet transform approach is a useful tool for investigation of noise mechanism of a transistor. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：2147 / 2153
页数：7
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