Estimation of detection limits in electron probe X-ray microanalysis

被引:2
|
作者
Romanenko, I. M. [1 ]
Viryus, A. A. [1 ]
Churin, V. A. [2 ]
Deyanov, A. S. [2 ]
Ivanov, A. S. [2 ]
机构
[1] Russian Acad Sci, Inst Expt Mineral, Chernogolovka 142432, Moscow Oblast, Russia
[2] IV Kurchatov Atom Energy Inst, Russian Res Ctr, Moscow 123182, Russia
基金
俄罗斯基础研究基金会;
关键词
Atomic Number; Neutron Technique; Light Element; Electron Beam Energy; Effective Atomic Number;
D O I
10.1134/S1027451012070105
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Different local methods of analysis are estimated with the aim of revealing the possibility for determining the minimum concentrations of chemical elements. Among all examined approaches, electron probe X-ray microanalysis (EPMA) has been chosen as the most accurate and promising technique. The dependences between the elemental detection limit and the analyzer's technical parameters are investigated. It has been ascertained that the experimentally determined detection limits of light elements are substantially higher than those of heavy elements. The reasons leading to the less efficient EPMA of light elements, as well as possible ways of elimination thereof, are discussed. It is demonstrated that an X-ray mirror can be used to reach the theoretically predicted detection limits of B, O, and C.
引用
收藏
页码:616 / 622
页数:7
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