Curvature Scale Space application to distorted object recognition and classification

被引:0
|
作者
Jacobson, Natan [1 ]
Nguyen, Truong [1 ]
Crosby, Frank [2 ]
机构
[1] Univ Calif San Diego, San Diego, CA 92103 USA
[2] Naval Surface Warfare ctr, Panama City, FL USA
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Contour classification methods which operate directly on an image are greatly affected by small magnitude transformations to the image. In this paper, a contour classification method is developed which takes advantage of Curvature Scale Space (CS2) and a linear Support Vector Machine (SVM) classifier. The CS2 representation boasts invariance to transformations including: scaling, rotation, translation and noise. In addition, the linear SVM is a robust tool for classification problems involving multiple labels. The combination of these tools produces a classifier well suited for object recognition in photographs where distortion is present.
引用
收藏
页码:2110 / +
页数:2
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