Image transfer with subwavelength resolution to metal-dielectric interface

被引：7
|
作者：
Intaraprasonk, Varat [2 ]
Yu, Zongfu [1 ]
Fan, Shanhui [1 ]
机构：
[1] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
[2] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 2011年 / 28卷 / 05期
关键词：
EVANESCENT FIELDS; SURFACE-PLASMONS; NANOLITHOGRAPHY; LENS; PHOTOLITHOGRAPHY; INTERFERENCE;
D O I：
10.1364/JOSAB.28.001335
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In image transfer, one aims to reproduce at an image plane the field distribution of the field at the source plane. We consider a near-field image transfer scheme where an image with subwavelength resolution can be transferred to a metal-dielectric interface. In this scheme, the presence of a surface plasmon polariton provides a large wave vector range where the transfer function is flat, thus enabling the image transfer with subwavelength resolution. (c) 2011 Optical Society of America
引用
收藏
页码：1335 / 1338
页数：4
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