On the Size of the Soft X-Ray Radiation Source Based on an X-Pinch

被引：3
|
作者：
Artyomov, A. P. [1 ]
Chaikovsky, S. A. [1 ,2 ]
Oreshkin, V. I. [1 ]
Fedunin, A. V. [1 ]
Rousskikh, A. G. [1 ]
Ratakhin, N. A. [1 ]
机构：
[1] Russian Acad Sci, Siberian Branch, Inst High Current Elect, Tomsk, Russia
[2] Russian Acad Sci, Ural Div, Inst Electrophys, Ekaterinburg, Russia
来源：
RUSSIAN PHYSICS JOURNAL | 2020年 / 62卷 / 12期
基金：
俄罗斯科学基金会;
关键词：
pulse radiography; soft x-ray radiation; X pinch; pulse power generator; low-inductance capacitor; dense high-temperature plasma; RADIOGRAPHY;
D O I：
10.1007/s11182-020-01966-z
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The advent of X-pinch based compact radiographs has significantly expanded the application field of pulsed radiography for diagnostics of fast processes. The key point here is the spatial resolution which these radiographs can provide. The method for determining the size of the soft x-ray (SXR) source based on diffraction imaging of opaque metallic wires and their comparison with the diffraction pattern calculated for an extended source in a given spectral range is presented in the paper. The X-pinch source sizes have been measured taking into account the sensitometric characteristic of the film and the scanner characteristics. By this method it has been shown that the diameter of the X-pinch radiation source for current rise rates in the range 0.7-1.35 kA/ns varies slightly for the spectral range hv >3 keV.
引用
收藏
页码：2194 / 2203
页数：10
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