Role of buffer surface morphology and alloying effects on the properties of InAs nanostructures grown on InP(001)

被引:142
|
作者
Brault, J
Gendry, M
Grenet, G
Hollinger, G
Desieres, Y
Benyattou, T
机构
[1] Ecole Cent Lyon, Elect Lab, LEAME, CNRS,UMR 5512, F-69131 Ecully, France
[2] Inst Natl Sci Appl, Phys Mat Lab, CNRS, UMR 5511, F-69621 Villeurbanne, France
关键词
D O I
10.1063/1.122634
中图分类号
O59 [应用物理学];
学科分类号
摘要
We show the role played by the buffer surface morphology and by alloying effects on the size, shape and lateral distribution of InAs nanostructures grown on InP(001) substrates by molecular beam epitaxy. Three buffers, viz., In0.53Ga0.47As, In0.52Al0.48As, and InP lattice matched on InP have been studied. Differences in nanostructure morphology and in carrier confinement have been evaluated by atomic force microscopy and by low-temperature photoluminescence measurements, respectively. Alongside the classical relaxation mode through two-dimensional/three-dimensional surface morphology change, a chemical relaxation mode has to be introduced as a competitive mode of relaxation of strained layers. This chemical relaxation mode, due to alloying between the InAs deposit and the buffer, is thought to be responsible for most of the observed differences in the InAs nanostructure properties. (C) 1998 American Institute of Physics. [S0003-6951(98)03146-5].
引用
收藏
页码:2932 / 2934
页数:3
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