Layout metrics for Euler diagrams

被引:19
|
作者
Flower, J [1 ]
Rodgers, P [1 ]
Mutton, P [1 ]
机构
[1] Brighton Univ, Brighton, E Sussex, England
关键词
Euler diagrams; graph drawing; layout metrics;
D O I
10.1109/IV.2003.1217990
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
We present an aesthetics based method for drawing Eider diagrams. Aesthetic layout metrics have been found to be useful in graph drawing algorithms, which use metrics motivated by aesthetic principles that aid user understanding of diagrams. We have taken a similar approach to Euler diagram drawing, and have defined a set of suitable metrics to be used within a hill climbing multicriteria optimiser to produce "good" drawings. There are added difficulties when drawing Euler diagrams as they are made up of contours whose structural properties of intersection and containment must be preserved under any layout improvements. In this paper we describe our Java implementation of a pair of hill climbing variants to find good drawings, a set of metrics that measure aesthetics for good diagram layout, and issues concerning the choice of weightings for a useful combination of the metrics.
引用
收藏
页码:272 / 280
页数:9
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