Evaluating Creep Deformation in Controlled Microstructures of Sn-3Ag-0.5Cu Solder

被引:7
|
作者
Gu, Tianhong [1 ]
Gourlay, Christopher M. [1 ]
Britton, T. Ben [1 ]
机构
[1] Imperial Coll London, Dept Mat, London SW7 2AZ, England
基金
英国工程与自然科学研究理事会;
关键词
Pb-free solder; creep; microstructure evolution; recrystallization; TERNARY 95.5SN-3.9AG-0.6CU SOLDER; AG-CU SOLDERS; MECHANICAL-PROPERTIES; BULK SOLDER; PART II; SN; BEHAVIOR; JOINTS; ALLOYS; TIN;
D O I
10.1007/s11664-018-6744-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The reliability of solder joints is affected significantly by thermomechanical properties such as creep and thermal fatigue. In this work, the creep of directionally solidified (DS) Sn-3Ag-0.5Cu wt.% (SAC305) dog-bone samples (gauge dimension: 10x2x1.5mm) with a controlled < 110 > or < 100 > fibre texture is investigated under constant load testing (stress level:approximate to 30MPa) at a range of temperatures from 20 degrees C to 200 degrees C. Tensile testing is performed and the secondary creep strain rate and the localised strain gradient are studied by two-dimensional optical digital image correlation (2-D DIC). The dominating creep mechanisms and their temperature dependence are explored at the microstructural scale using electron backscatter diffraction (EBSD), which enables the understanding of the microstructural heterogeneity of creep mechanisms at different strain levels, temperatures and strain rates. Formation of subgrains and the development of recrystallization are observed with increasing strain levels. Differences in the deformation of -Sn in dendrites and in the eutectic regions containing Ag3Sn and Cu6Sn5 are studied and related to changes in local deformation mechanisms.
引用
收藏
页码:107 / 121
页数:15
相关论文
共 50 条
  • [31] Evaluations of Whisker Growth and Fatigue Reliability of Sn-3Ag-0.5Cu and Sn-3Ag-0.5Cu-0.05Ce Solder Ball Grid Array Packages
    Chuang, Tung-Han
    Cheng, Chih-Yuan
    Chang, Tao-Chih
    JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (12) : 2762 - 2769
  • [32] Influence of bismuth (Bi) addition on wetting characteristics of Sn-3Ag-0.5Cu solder alloy on Cu substrate
    Erer, Ahmet Mustafa
    Oguz, Serkan
    Turen, Yunus
    ENGINEERING SCIENCE AND TECHNOLOGY-AN INTERNATIONAL JOURNAL-JESTECH, 2018, 21 (06): : 1159 - 1163
  • [33] Evaluations of Whisker Growth and Fatigue Reliability of Sn-3Ag-0.5Cu and Sn-3Ag-0.5Cu-0.05Ce Solder Ball Grid Array Packages
    Tung-Han Chuang
    Chih-Yuan Cheng
    Tao-Chih Chang
    Journal of Electronic Materials, 2009, 38 : 2762 - 2769
  • [34] Selective electrochemical etching of the Sn-3Ag-0.5Cu/0.07 wt% graphene nanoparticle composite solder
    Ahmad, Ibrahym
    Nazeri, Muhammad Firdaus Mohd
    Salleh, Nor Azmira
    Kheawhom, Soorathep
    Erer, Ahmet Mustafa
    Kurt, Adem
    Mohamad, Ahmad Azmin
    ARABIAN JOURNAL OF CHEMISTRY, 2021, 14 (10)
  • [35] Impact Properties of Sn-3Ag-0.5Cu Solder Ball Joint with Epoxy-Based Flux
    Ishiyama, Akiyoshi
    Shohji, Ikuo
    Ganbe, Tatsuya
    Watanabe, Hirohiko
    2014 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP), 2014, : 766 - 769
  • [36] Torsional fatigue with axial constant stress for Sn-3Ag-0.5Cu lead-free solder
    Liang, Ting
    Liang, Yongfeng
    Fang, Jiaye
    Chen, Gang
    Chen, Xu
    INTERNATIONAL JOURNAL OF FATIGUE, 2014, 67 : 203 - 211
  • [37] The effect of Bi on the IMC growth in Sn-3Ag-0.5Cu solder interface during aging process
    Qi, L
    Zhao, J
    Wang, XM
    Wang, L
    2004 INTERNATIONAL CONFERENCE ON THE BUSINESS OF ELECTRONIC PRODUCT RELIABILITY AND LIABILITY, PROCEEDINGS, 2004, : 42 - 46
  • [38] Effect of Solder Volume on Interfacial Reaction between Sn-3Ag-0.5Cu Solder Ball and Cu Pad after Multiple Reflows
    Liu, Luwei
    Huang, Mingliang
    Yang, Fan
    Liu, Ting
    2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP), 2011, : 327 - 332
  • [39] Influence of ZnO Particles Addition on Interface Morphology Evolution of Sn-3Ag-0.5Cu Solder Joints
    Qu, Min
    Cao, Tianze
    Cui, Yan
    Liu, Fengbin
    Jiao, Zhiwei
    MATERIALS SCIENCE, ENERGY TECHNOLOGY AND POWER ENGINEERING II (MEP2018), 2018, 1971
  • [40] Effect of Interfacial Reaction on Joint Strength of Semiconductor Metallization and Sn-3Ag-0.5Cu Solder Ball
    Yorita, Chiko
    Kobayashi, Tatsuya
    Shohji, Ikuo
    FRACTURE AND STRENGTH OF SOLIDS VII, PTS 1 AND 2, 2011, 462-463 : 849 - +