Effect of current sweep rate on critical current of superconducting Ag-Bi-2223 tapes

被引:25
|
作者
Ding, SY [1 ]
Ren, C
Yao, XX
Sun, Y
Zhang, H
机构
[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Met, Shanghai 200080, Peoples R China
基金
中国国家自然科学基金;
关键词
V-I curve; I-c measurement; Ag-B; 2223; tape;
D O I
10.1016/S0011-2275(98)00072-1
中图分类号
O414.1 [热力学];
学科分类号
摘要
The effect of sweep rate of applied current (dl/dt) on critical current (I-c) of Ag-sheathed Bi2PbxSr2-xCa2Cu3Oy (Ag-Bi-2223) tapes was studied by the four-probe measurement method of V-l curves. It was found that the V-l curves were affected apparently by dl/dt, resulting I-c, decreases with increasing dl/dt for all critical current criterions used here. This result implies that the I-c determined at very large dl/dt supplied, for example, by the pure current system will be significantly smaller than the I-c measured at small dl/dt usually used in the d.c. method. The possible influences of the present results on published V-l data and I-c measurement technique are discussed. We have shown that the ohmic heat at the current contact leads of our Ag-sheathed Bi-2223 samples immersed in liquid nitrogen is negligible. (C) 1998 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:809 / 812
页数:4
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