The effect of dielectric charging on capacitive MEMS switch

被引:1
|
作者
Huang, Qinwen [1 ]
Li, Xiangguang [1 ,2 ]
Wang Yunhui [1 ]
Jia, Yu-bin [3 ]
机构
[1] Sci & Technol Reliabil Phys & Applicat Technol El, Guangzhou 510610, Guangdong, Peoples R China
[2] North Univ China, Sch Informat & Commun Engn, Taiyuan 030051, Peoples R China
[3] Peking Univ, Inst Microelect, Beijing 100871, Peoples R China
来源
SENSORS, MECHATRONICS AND AUTOMATION | 2014年 / 511-512卷
关键词
dielectric charging; one-dimensional model; charge density; surface roughness;
D O I
10.4028/www.scientific.net/AMM.511-512.732
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Based on a one-dimensional model of dielectric charging for capacitive RFMEMS switches, the accumulated charge density and actuation voltage shift were simulated. The results illustrate that rougher surface can reduce dielectric charging, so the dielectric layer should be fabricated much rougher during deposition process. But the capacitance ratio of switch will be decreased with rougher surface, which can cause a reduction of switch performance. Thus the dielectric surface roughness should be balanced in reliability and isolation.
引用
收藏
页码:732 / +
页数:2
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