Performance of a Broad-Band, High-Resolution, Transition-Edge Sensor Spectrometer for X-ray Astrophysics

被引：20

作者：

Smith, Stephen J. ^{[1
]}

Adams, Joseph S. ^{[1
]}

Bandler, Simon R. ^{[1
]}

Beaumont, Sophie ^{[1
]}

Chervenak, James A. ^{[1
]}

Denison, Edward, V ^{[2
]}

Doriese, William B. ^{[2
]}

Durkin, Malcolm ^{[2
]}

Finkbeiner, Fred M. ^{[1
]}

Fowler, Joseph W. ^{[2
]}

Hilton, Gene C. ^{[2
]}

Hummatov, Ruslan ^{[1
]}

Irwin, Kent D. ^{[3
]}

Kelley, Richard L. ^{[1
]}

Kilbourne, Caroline A. ^{[1
]}

Leutenegger, Maurice A. ^{[1
]}

Miniussi, Antoine R. ^{[1
]}

Porter, Frederick S. ^{[1
]}

Reintsema, Carl D. ^{[2
]}

Sadleir, John E. ^{[1
]}

Sakai, Kazuhiro ^{[1
]}

Swetz, Daniel S. ^{[2
]}

Ullom, Joel N. ^{[2
]}

Vale, Leila R. ^{[2
]}

Wakeham, Nicholas A. ^{[1
]}

Wassell, Edward J. ^{[1
]}

Witthoeft, Michael C. ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

[2] NIST, Boulder, CO 80305 USA

[3] Stanford Univ, Stanford, CA 94305 USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2021年 / 31卷 / 05期

关键词：

X-ray spectroscopy; imaging array; multiplexed readout; transition-edge sensor; Athena space telescope; MICROCALORIMETER; LINES;

D O I：

10.1109/TASC.2021.3061918

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Future X-ray astrophysics experiments require multiplexed readout of high fill-factor, kilo-pixel arrays of transition-edge sensors (TESs), with very high spectral resolution over a broad range of energies. In this paper we report on a prototype kilo-pixel array of Mo/Au TESs readout with 8-column by 32-row time-division multiplexing (TDM). This system is being used to demonstrate the critical detector and readout technology for ESA's Athena X-IFU, and when complete will be used in laboratory astrophysics experiments. Our array and TDM readout have demonstrated a combined full-width-at-half-maximum energy resolution, including > 200 pixels, of: 1.95 eV for Ti-K alpha (4.5 keV), 1.97 eV for Mn-K alpha (5.9 keV), 2.16 eV for Co-K alpha (6.9 keV), 2.33 eV for Cu-K alpha (8 keV), 3.26 eV for Br-K alpha (11.9 keV). The 1 sigma statistical errors are <= 0.01 eV for all spectra. These results meet the broad-band resolution requirements for X-IFU with margin.

引用

页数：6

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