Organizational tailoring of the CMM questionnaire for internal process improvement

被引:0
|
作者
Pryor, AN
McGuire, EG
机构
关键词
D O I
10.1109/PICMET.1997.653536
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Some organizations are attempting to reduce the time and cost required by formal process improvement models by tailoring those models to specific needs. This paper describes a tailored version of the Software Engineering Institute's (SEI) Capability Maturity Model (CMM) questionnaire which was developed by a large U.S. based Fortune 500 company for low-cost internal process improvement purposes.
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页码:621 / 624
页数:4
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