Evaluation of thin films intermixing by photoacoustic spectroscopy

被引：5
|
作者：
Riech, I [1 ]
Zambrano, M. [1 ]
Abelenda, A. [1 ]
Maldonado, F. [1 ]
Rojas-Marroquin, A. [2 ]
Jaime, J. [2 ]
Calderon, A. [2 ]
Marin, E. [2 ]
机构：
[1] Univ Autonoma Yucatan, Fac Ingn, Merida, Yucatan, Mexico
[2] Inst Politecn Nacl, Ctr Invest Ciencia Aplicada & Tecnol Avanzada CIC, Unidad Legaria, Ciudad De Mexico, Mexico
来源：
THIN SOLID FILMS | 2021年 / 735卷 / 735期
关键词：
photoacoustic spectroscopy; thin film heterostructure; intermixing; OPTICAL-ABSORPTION SPECTRA; SURFACE; LAYERS;
D O I：
10.1016/j.tsf.2021.138871
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this paper, we show the usefulness of photoacoustic spectroscopy (PAS) to monitor the intermixing at the thin films heterojunction. CdTe/CdS bilayers with different thicknesses were used to analyze the effect of S-Te interdiffusion on the PAS spectra. Unlike the spectrum measured by the optical transmittance technique, the photoacoustic spectrum shows an optical absorption band, in addition to the absorption edge corresponding to the CdTe layer. The position of the band changes from 2.31 to 1.93 eV depending on the CdTe layer thickness in the structure. The band shifts were associated with the composition of the ternary CdS1-xTex alloy at the interface. Our interpretation of the results was supported by the PAS-Phase-Resolved and the X-Ray photoelectron spectroscopy techniques.
引用
收藏
页数：7
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