Epitaxial growth of (100)-oriented β-FeSi2 thin films on insulating substrates

被引:6
|
作者
Akiyama, K
Kaneko, S
Kimura, T
Funakubo, H
机构
[1] Kanagawa Ind Technol Res Inst, Kanagawa 2430435, Japan
[2] Tokyo Inst Technol, Dept Innovat & Engineered Mat, Midori Ku, Tokyo 152, Japan
关键词
beta-FeSi(2); epitaxial film; insulating substrate; rf sputtering;
D O I
10.1143/JJAP.44.2496
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial beta-FeSi(2) thin films were grown on insulating substrates by rf magnetron sputtering. (100)-Oriented beta-FeSi(2) films were epitaxially grown on (100) yttria-stabilized zirconia (YSZ) and (001) Al(2)O(3) substrates. The epitaxial relationship of the beta-FeSi(2) film with the (100) YSZ substrate was the same as that with the (100) Si substrate. On the (001) Al(2)O(3) substrate, the epitxial film had a threefold symmetry domain structure, which has not been reported on a film grown on a Si substrate. Epitaxial growth of (100)-oriented beta-FeSi(2) film was affected by not only lattice mismatch but also atomic or ionic matching between beta-FeSi(2) and substrate and requires substrates consisting of either a single element or only cations.
引用
收藏
页码:2496 / 2501
页数:6
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