(119) Oriented Bi-2223 thin films grown on (100) NdGaO3 by MOCVD

Orientation control of high T-c superconductors is essential for superior device performance, because the coherence length is longer along the non c-axis directions than along c-axis direction. In this study, we report on the first successful preparation of (119) oriented Bi-2223 films by MOCVD using (100) NdGaO3 Substrates. Atomic force microscopy observations of the (119) Bi-2223 films are also reported. Our films have an in-plane aligned mountain-range-shaped surface morphology. This morphology is resulting from the epitaxial relationship between the (119) Bi-2223 film and (100) NdGaO3 substrate. Films exhibited a large in-plane anisotropy as revealed by, resistivity measurements and surface morphology observations.