机构:
Guangxi Normal Univ, Coll Math, Guilin 541004, Peoples R China
Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R ChinaGuangxi Normal Univ, Coll Math, Guilin 541004, Peoples R China
Zhang, Junjian
[1
,2
]
Li, Guoying
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h-index: 0
机构:
Chinese Acad Sci, Acad Math & Syst Sci, Beijing 100190, Peoples R ChinaGuangxi Normal Univ, Coll Math, Guilin 541004, Peoples R China
Li, Guoying
[3
]
机构:
[1] Guangxi Normal Univ, Coll Math, Guilin 541004, Peoples R China
[2] Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
[3] Chinese Acad Sci, Acad Math & Syst Sci, Beijing 100190, Peoples R China
Asymptotic distribution;
goodness-of-fit;
integral-type tests;
power comparison;
RATIO;
D O I:
10.1007/s11424-010-8264-9
中图分类号:
O1 [数学];
学科分类号:
0701 ;
070101 ;
摘要:
A family of integral-type goodness-of-fit tests is investigated. This family includes some existing tests, such as the Cram,r-von Mises test and Anderson-Darling test, etc. The asymptotic distributions of the tests in the family under the null and local alternative hypotheses are established. The almost sure convergence under a fixed underlying distribution is obtained. Furthermore, simulations are conducted to compare the powers of the tests in the family. Simulation results show that for different alternatives, the more powerful tests are different, and the parameter lambda has great influence on the tests in small sample cases.
机构:
Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30032 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30032 USA
Shapiro, Alexander
Xie, Yao
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h-index: 0
机构:
Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30032 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30032 USA
Xie, Yao
Zhang, Rui
论文数: 0引用数: 0
h-index: 0
机构:
Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30032 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30032 USA