共 50 条
- [35] Tilt of atomic force microscope cantilevers: Effect on friction measurements PROGRESSES IN FRACTURE AND STRENGTH OF MATERIALS AND STRUCTURES, 1-4, 2007, 353-358 : 742 - 745
- [36] Atomic force microscopy characterization of interface roughness of V-shaped AlGaAs/GaAs quantum wire MORPHOLOGICAL AND COMPOSITIONAL EVOLUTION OF HETEROEPITAXIAL SEMICONDUCTOR THIN FILMS, 2000, 618 : 47 - 52
- [37] A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02): : 403 - 405
- [38] Device for the determination of spring constants of atomic force microscope cantilevers and micromachined springs REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (06): : 2483 - 2485