Delafossite CuFeO2 thin films electrochemically grown from a DMSO based solution

被引:15
|
作者
Riveros, G. [1 ]
Garin, C. [2 ]
Ramirez, D. [1 ]
Dalchiele, E. A. [3 ]
Marotti, R. E. [3 ]
Pereyra, C. J. [3 ]
Spera, E. [3 ]
Gomez, H. [4 ]
Grez, P. [4 ]
Martin, F. [5 ,6 ]
Ramos-Barrado, J. R. [5 ,6 ]
机构
[1] Univ Valparaiso, Inst Quim & Bioquim, Fac Ciencias, Valparaiso, Chile
[2] Univ Tecn Federico Santa Maria, Dept Fis, Valparaiso, Chile
[3] Univ Republica, Inst Fis, Fac Ingn, Montevideo 11000, Uruguay
[4] Pontificia Univ Catolica Valparaiso, Inst Quim, Valparaiso, Chile
[5] Univ Malaga, Lab Mat & Superficies, Unidad Asociada CSIC, Dept Fis Aplicada, E-29071 Malaga, Spain
[6] Univ Malaga, Lab Mat & Superficies, Unidad Asociada CSIC, Dept Ingn Quim, E-29071 Malaga, Spain
关键词
Delafossite; CuFeO2; electrodeposition; OPTOELECTRONIC PROPERTIES; OXIDE SEMICONDUCTORS; ELECTRONIC-STRUCTURE; OPTICAL-PROPERTIES; FIELD-EMISSION; ELECTRODEPOSITION; ZNO; PERFORMANCE; NANOPARTICLES; REDUCTION;
D O I
10.1016/j.electacta.2015.02.226
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
This study shows the results obtained in the direct electrodeposition of CuFeO2 thin films from a DMSO based solution. First, a detailed electrochemical study was carried out in order to determinate the best condition for the CuFeO2 electrodeposition. The films were obtained potentiostatically from a 0.01 M CuCl2 + 0.005 M Fe(ClO4)(3) + 0.1 M LiClO4 solution in the presence of molecular oxygen at 50 degrees C onto FTO/glass substrates. In all cases, the time of electrodeposition was 1000 s. The grown films presented a yellow-reddish color and exhibit an homogeneous aspect. Analyses of composition carried out through EDS, shown that a stoichiometric composition (atomic relation Cu:Fe = 1: 1) is obtained at a potential of -0.6 V. However, as-grown films analyzed through XRD experiences did not evidence the presence of CuFeO2 compound presumably because it is amorphous. An annealing treatment at 650 degrees C for 30 minutes in an argon atmosphere was necessary to transform the solid phase of the as grown films in crystalline CuFeO2. Furthermore, the presence of CuFeO2 has been confirmed through XPS analyses. UV-vis analyzes shown a ladder-like appearance due to the presence of several absorption edges from the IR to the UV spectrum region. The most clearly determined were a direct-like edge at the IR: E-g(IR) = 1.64 eV. However, several absorption edges in the visible (E-g (dir)(vis) = 2.35 eV, and E-g (ind)(vis) = 2.03 eV) and UV beginning (E-g (ind)(UV) = 3.37 eV) spectrum region also were observed. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:297 / 306
页数:10
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