RETRACTION: New devices Si-rich and C-rich a-Si1-xCx thin films gas sensors based (Retraction of Vol 579, Pg 365, 2013)

被引：0

作者：

Ouadfel, M. A. ^{[1
,2
]}

Yaddaden, C. ^{[1
]}

Merazga, S. ^{[3
]}

Cheriet, A. ^{[1
]}

Talb, L. ^{[1
]}

Kaci, S. ^{[1
]}

Belkacem, Y. ^{[1
]}

Ouadah, Y. ^{[1
]}

Menous, I. ^{[1
]}

Kechouane, M. ^{[2
]}

Gabouze, N. ^{[1
]}

Keffous, A. ^{[1
]}

Menari, H. ^{[1
]}

机构：

[1] CRTSE, 02 Bd,Frantz FANON,BP 140, Algiers, Algeria

[2] USTHB, Phys Fac, Phys Mat Lab, Algiers, Algeria

[3] Mentouri Ahmed Univ, Constantine, Algeria

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 2018年 / 769卷

关键词：

D O I：

10.1016/j.jallcom.2018.09.239

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1149 / 1149

页数：1

共 7 条

[1] New devices Si-rich and C-rich a-Si1-xCx thin films gas sensors based
Keffous, A. (keffousa@yahoo.fr), 1600, Elsevier Ltd (579):
[2] RETRACTED: New devices Si-rich and C-rich a-Si1-xCx thin films gas sensors based (Retracted article. See vol. 769, pg. 1149, 2018)
Ouadfel, M. A.
Yaddaden, C.
Merazga, S.
Cheriet, A.
Talb, L.
Kaci, S.
Belkacem, Y.
Ouadah, Y.
Menous, I.
Kechouane, M.
Gabouze, N.
Keffous, A.
Menari, H.
JOURNAL OF ALLOYS AND COMPOUNDS, 2013, 579 : 365 - 371
[3] Microstructure and photoluminescence properties of as-deposited and annealed Si-rich a-Si1-xCx:H films
Wang, Y
Yue, RF
Li, GH
Han, HX
Liao, XB
APPLIED SURFACE SCIENCE, 2001, 180 (1-2) : 87 - 91
[4] Si-rich a-Si1-xCx thin films by d.c. magnetron co-sputtering of silicon and silicon carbide: Structural and optical properties
Ouadfel, M. A.
Keffous, A.
Brighet, A.
Gabouze, N.
Hadjersi, T.
Cheriet, A.
Kechouane, M.
Boukezzata, A.
Boukennous, Y.
Belkacem, Y.
Menari, H.
APPLIED SURFACE SCIENCE, 2013, 265 : 94 - 100
[5] Structural properties and preparation of Si-rich Si1-xCx thin films by radio-frequency magnetron sputtering
He, Yisong
Ye, Chao
Wang, Xiangying
Gao, Mingwei
Guo, Jiaming
Yang, Peifang
APPLIED SURFACE SCIENCE, 2016, 363 : 477 - 482
[6] Nanoparticle-assisted Frenkel–Poole emission in two-terminal charging-controlled memory devices based on Si-rich silicon nitride thin films
Zhen Liu
Xiao Lin Wang
Jen It Wong
Zhan Hong Cen
T. P. Chen
Hai Yan Zhang
Applied Physics A, 2017, 123
[7] Nanoparticle-assisted Frenkel-Poole emission in two-terminal charging-controlled memory devices based on Si-rich silicon nitride thin films
Liu, Zhen
Wang, Xiao Lin
Wong, Jen It
Cen, Zhan Hong
Chen, T. P.
Zhang, Hai Yan
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2017, 123 (10):

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