Critical properties of symmetric nanoscale metal-ferroelectric-metal capacitors (vol 58, pg 3050, 2010)

被引:0
|
作者
Zheng, Yue [1 ]
Cai, M. Q. [1 ]
Woo, C. H. [1 ]
机构
[1] Hong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong, Hong Kong, Peoples R China
关键词
D O I
10.1016/j.actamat.2010.06.048
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:5871 / 5871
页数:1
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