Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate

被引:29
|
作者
Mastropietro, F. [1 ,2 ]
Carbone, D. [2 ]
Diaz, A. [2 ]
Eymery, J. [1 ]
Sentenac, A. [3 ]
Metzger, T. H. [2 ]
Chamard, V. [3 ]
Favre-Nicolin, V. [1 ,4 ]
机构
[1] INAC, UJF Grenoble 1, UMR E CEA, SP2M, F-38054 Grenoble, France
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[3] Aix Marseille Univ, Ecole Centrale Marseille, CNRS, Inst Fresnel, F-13013 Marseille, France
[4] Univ Grenoble 1, Grenoble, France
来源
OPTICS EXPRESS | 2011年 / 19卷 / 20期
关键词
PHASE RETRIEVAL; DIFFRACTION; RESOLUTION;
D O I
10.1364/OE.19.019223
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A detailed characterization of the coherent x-ray wavefront produced by a partially illuminated Fresnel zone plate is presented. We show, by numerical and experimental approaches, how the beam size and the focal depth are strongly influenced by the illumination conditions, while the phase of the focal spot remains constant. These results confirm that the partial illumination can be used for coherent diffraction experiments. Finally, we demonstrate the possibility of reconstructing the complex-valued illumination function by simple measurement of the far field intensity in the specific case of partial illumination. (C) 2011 Optical Society of America
引用
收藏
页码:19223 / 19232
页数:10
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