Computational modeling of SiC epitaxial growth in a hot wall reactor

被引:14
|
作者
Ji, W [1 ]
Lofgren, PM
Hallin, C
Gu, CY
Zhou, G
机构
[1] ABB Corp Res, S-72178 Vasteras, Sweden
[2] Royal Inst Technol, Faxen Lab, S-10044 Stockholm, Sweden
[3] Linkoping Univ, IFM, S-58183 Linkoping, Sweden
关键词
CVD; SiC; model;
D O I
10.1016/S0022-0248(00)00843-5
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
A computational model for chemical vapor deposition (CVD) of silicon carbide (SiC) in a hot-wall reactor is developed, where the susceptor is tapered with a rectangular cross-section. The present work focuses on the advection-diffusion-reaction process in the susceptor. The precursors are propane and silane, and the carrier gas is hydrogen with mass fraction higher than 99%. Computed growth rates under different system pressures and precursor concentrations are compared to the experimental data measured on samples grown in the Linkoping CVD reactor. The gas composition distribution in the susceptor and the growth rate profile on the susceptor floor are shown and analyzed. Dependence of the growth rate on precursor concentrations is investigated. It is demonstrated that the growth rate of SiC may either be carbon transport limited or silicon controlled, depending on the input carbon-to-silicon ratio. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:560 / 571
页数:12
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