共 50 条
- [1] THE CHARACTERIZATION OF MATERIALS BY SPECTROSCOPIC ELLIPSOMETRY PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 452 : 60 - 70
- [2] SURFACE CHARACTERIZATION BY SPECTROSCOPIC INFRARED ELLIPSOMETRY FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1993, 346 (1-3): : 358 - 361
- [5] Synchrotron infrared spectroscopic ellipsometry for characterization of biofunctional surfaces PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2010, 247 (08): : 1925 - 1931
- [7] Spectroscopic ellipsometry of materials for infrared micro-device fabrication PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5, 2008, 5 (05): : 1113 - +
- [9] SPECTROSCOPIC ELLIPSOMETRY CHARACTERIZATION OF SILICON-ON-INSULATOR MATERIALS MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1990, 5 (02): : 301 - 307