Infrared spectroscopic ellipsometry for biomolecular materials characterization

被引:0
|
作者
不详
机构
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:123 / 123
页数:1
相关论文
共 50 条
  • [1] THE CHARACTERIZATION OF MATERIALS BY SPECTROSCOPIC ELLIPSOMETRY
    ASPNES, DE
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 452 : 60 - 70
  • [2] SURFACE CHARACTERIZATION BY SPECTROSCOPIC INFRARED ELLIPSOMETRY
    ROSELER, A
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1993, 346 (1-3): : 358 - 361
  • [3] SPECTROSCOPIC ELLIPSOMETRY IN THE INFRARED
    ROSELER, A
    INFRARED PHYSICS, 1981, 21 (06): : 349 - 355
  • [4] Infrared spectroscopic ellipsometry for the characterization of hybrid bilayer membranes
    Meuse, CW
    BIOPHYSICAL JOURNAL, 1999, 76 (01) : A55 - A55
  • [5] Synchrotron infrared spectroscopic ellipsometry for characterization of biofunctional surfaces
    Sun, Guoguang
    Rosu, Dana Maria
    Zhang, Xin
    Hovestaedt, Marc
    Pop, Simona
    Schade, Ulrich
    Aulich, Dennis
    Gensch, Michael
    Ay, Bernhard
    Holzhuetter, Hermann-Georg
    Zahn, Dietrich R. T.
    Esser, Norbert
    Volkmer, Rudolf
    Rappich, Joerg
    Hinrichs, Karsten
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2010, 247 (08): : 1925 - 1931
  • [6] Combined characterization of conductive materials by infrared spectroscopic ellipsometry and grazing X-ray reflectance
    Boher, P
    Luttmann, M
    Stehle, JL
    Hennet, L
    THIN SOLID FILMS, 1998, 319 (1-2) : 67 - 72
  • [7] Spectroscopic ellipsometry of materials for infrared micro-device fabrication
    Folks, W. R.
    Ginn, J.
    Shelton, D.
    Tharp, J.
    Boreman, G.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5, 2008, 5 (05): : 1113 - +
  • [8] Nanostructure characterization of high k materials by spectroscopic ellipsometry
    Pereira, L.
    Aguas, H.
    Fortunato, E.
    Martins, R.
    APPLIED SURFACE SCIENCE, 2006, 253 (01) : 339 - 343
  • [9] SPECTROSCOPIC ELLIPSOMETRY CHARACTERIZATION OF SILICON-ON-INSULATOR MATERIALS
    VANHELLEMONT, J
    MAES, HE
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1990, 5 (02): : 301 - 307
  • [10] Infrared spectroscopic ellipsometry - a new tool for characterization of semiconductor heterostructures
    Kasic, A
    Schubert, M
    Einfeldt, S
    Hommel, D
    VIBRATIONAL SPECTROSCOPY, 2002, 29 (1-2) : 121 - 124