Electronic structure and transport properties of doped PbSe

被引:56
|
作者
Peng, Haowei [1 ]
Song, Jung-Hwan [1 ]
Kanatzidis, M. G. [2 ]
Freeman, Arthur J. [1 ]
机构
[1] Northwestern Univ, Dept Phys & Astron, Evanston, IL 60208 USA
[2] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA
关键词
INITIO MOLECULAR-DYNAMICS; TOTAL-ENERGY CALCULATIONS; SEMICONDUCTORS; EFFICIENCY;
D O I
10.1103/PhysRevB.84.125207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Understanding the electronic structure and transport properties of doped PbSe for its thermoelectric applications is an urgent need. Using a first-principles approach, we first explore the band structures of PbSe doped with a series of impurities, including cation-site substitutional impurities (Na, K, Rb; Mg, Ca, Sr; Cu, Ag, Au; Zn, Cd, Hg; Ga, In, Tl; Ge, Sn; As, Sb, Bi) and anion-site substitutional impurities (P, As, Sb; O, S, Te). Then we calculate the density of states (DOS) difference between the doped samples and pure host sample, which is a useful quantity to recognize the possibility of improving transport properties. The exhibited chemical trends and the nature of the impurity states are well explained with a simplified linear combination of atomic orbitals (LCAO) picture. Finally, we calculate the transport properties of these doped systems within the framework of Boltzmann theory and constant relaxation time approximation. Typical competing behavior between the electrical conductivity and Seebeck coefficient is exhibited, and a significant enhancement of thermoelectric power factor is found in the cation-site Au-doped p-type samples, and cation-site As-doped n-type samples.
引用
收藏
页数:13
相关论文
共 50 条
  • [21] Electrical and thermoelectric properties of PbSe doped with Sm
    Ibrahim, M. M.
    Saleh, S. A.
    Ibrahim, E. M. M.
    Hakeem, A. M. Abdel
    JOURNAL OF ALLOYS AND COMPOUNDS, 2008, 452 (02) : 200 - 204
  • [22] Electronic structure and transport properties of quantum dots
    Tews, M
    ANNALEN DER PHYSIK, 2004, 13 (05) : 249 - 304
  • [23] Electronic structure and transport properties of Si nanotubes
    Li, Jing
    Gu, Tang
    Delerue, Christophe
    Niquet, Yann-Michel
    JOURNAL OF APPLIED PHYSICS, 2013, 114 (05)
  • [24] Effect of Air Exposure on Surface Properties, Electronic Structure, and Carrier Relaxation in PbSe Nanocrystals
    Sykora, Milan
    Koposov, Alexey Y.
    McGuire, John A.
    Schulze, Roland K.
    Tretiak, Olexandr
    Pietryga, Jeffrey M.
    Klimov, Victor I.
    ACS NANO, 2010, 4 (04) : 2021 - 2034
  • [25] Structural and Electronic Transport Properties in Sr-Doped BiCuSeO
    Barreteau, Celine
    Berardan, David
    Amzallag, Emilie
    Zhao, LiDong
    Dragoe, Nita
    CHEMISTRY OF MATERIALS, 2012, 24 (16) : 3168 - 3178
  • [26] Magnetic and electronic transport properties of Mn-doped silicon
    Ma, S. B.
    Sun, Y. P.
    Zhao, B. C.
    Tong, P.
    Zhu, X. B.
    Song, W. H.
    SOLID STATE COMMUNICATIONS, 2006, 140 (3-4) : 192 - 196
  • [27] Study of Electronic transport properties of doped 8AGNR
    Sharma, Uma Shankar
    Srivastava, Anurag
    Verma, U. P.
    SOLID STATE PHYSICS: PROCEEDINGS OF THE 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B, 2014, 1591 : 1386 - 1388
  • [28] Study of electronic transport properties of doped 8AGNR
    20142717882473
    (1) Rustamji Institute of Technology, BSF Academy Tekanpur, Gwalior-475005, India; (2) Advanced Materials Research Group, Computational Nanoscience and Technology Lab, ABV-Indian Institute of Information Technology and Management, Gwalior-474015, India; (3) School of Studies in Physics, Jiwaji University, Gwalior-474011, India, 1600, Board of Research in Nuclear Sciences; Department of Atomic Energy; Government of India (American Institute of Physics Inc.):
  • [29] Electronic and transport properties of N-P doped nanotubes
    Esfarjani, K
    Farajian, AA
    Hashi, Y
    Kawazoe, Y
    APPLIED PHYSICS LETTERS, 1999, 74 (01) : 79 - 81
  • [30] The Electronic Transport Properties of CuO and Zn Doped CuO Nanotubes
    Muthaiyan, L.
    Sriram, S.
    Balamurugan, D.
    INTERNATIONAL JOURNAL OF NANOELECTRONICS AND MATERIALS, 2018, 11 (01): : 33 - 42