Challenges and Limits of the Interferometric Precision Measurement Technique

被引:0
|
作者
Jaeger, Gerd [1 ]
机构
[1] Tech Univ Ilmenau, Inst Prozessmess & Sensortech, Fak Maschinenbau, Ilmenau, Germany
关键词
Heterodyne and homodyne interferometers; metrological analysis; Abbe-error free design; nanopositioning and nanomeasuring machine;
D O I
10.1524/teme.2011.0122
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The most important principle, the basis and operation of heterodyne and homodyne interferometers are discussed. Their benefits and limitations are covered based on a metrological analysis. The resolution of interferometers can be determined by calculating the smallest resolvable distance increment. An Abbe-error-free design is explained using interferometers by means of a nanopositioning and nanomeasuring machine developed at the Institute of Process Measurement and Sensor Technology (Ilmenau University of Technology) and manufactured at the SIOS Messtechnik GmbH Ilmenau, Germany.
引用
收藏
页码:114 / 117
页数:4
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