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Modeling of threshold voltage and subthreshold swing of short-channel SOI MESFET's
被引:17
|作者:
Chiang, TK
[1
]
Wang, YH
[1
]
Houng, MP
[1
]
机构:
[1] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
关键词:
D O I:
10.1016/S0038-1101(98)00240-8
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Short-channel effects on the subthreshold behavior are modeled for fully depicted Si-SOI MESFETs through an analytical solution of the two-dimensional Poisson equation in the subthreshold region. Based on the resultant minimum bottom potential caused by drain-induced barrier lowering, accurate analytical expressions for short-channel threshold voltage and subthreshold swing are derived. This model is verified by comparison to a two-dimensional device simulator, MEDICI, over a wide range of device parameters and bias conditions. Good agreement is obtained for channel lengths down to 0.2 mu m. (C) 1998 Elsevier Science Ltd. All rights reserved.
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页码:123 / 129
页数:7
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