Polarization electric field;
GaN/InxGa1-xN superlattices;
Phonon scattering;
Phonon mean free path;
Thermal boundary resistance;
Thermal conductivity;
MACROSCOPIC POLARIZATION;
BOUNDARY RESISTANCE;
HEAT-TRANSPORT;
GAN FILMS;
DEPENDENCE;
SI/SIGE;
D O I:
10.1016/j.jallcom.2021.162927
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
In this paper, polarization electric field (PEF) induced in GaN/InxGa1-xN superlattice (SL) was studied and found it can be treated as a reductant of thermal conductivity (k). Elastic properties and phonon group velocity are modified by the impact of interfacial PEF as by inverse piezoelectric effect. It improves scattering and thermal resistance at the boundaries because of dissimilarity in specific heat and group velocity, that decreases transmission coefficient of phonon and more acoustic mismatches resulting in reduction of in-plane (k(ip)) as well as cross-plane (k(cp)) thermal conductivities. k(ip) of InxGa1-xN (5 nm)/GaN (10 nm) SL with (without) interfacial PEF field are 7.807 (8.921), 7.350 (8.355) and 7.018 (8.090) Wm(-1)K(-1) respectively, for x= 0.1, 0.3 and 0.5; whereas k(cp) for the similar compositions are respectively, 4.652 (5.710), 4.282 (5.221) and 4.081(5.185) Wm(-1)K(-1) at 300 K demonstrating the reduction exceeds 20%. It shows that the optimal k can be accomplished with the adaptation of nitride SL's electric field for thermoelectric improvements. (C) 2021 Elsevier B.V. All rights reserved.
机构:
USA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Woodward, Nathaniel
Gallinat, C.
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USA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Gallinat, C.
Rodak, L. E.
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USA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Rodak, L. E.
Metcalfe, G. D.
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USA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Metcalfe, G. D.
Shen, H.
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USA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Shen, H.
Wraback, M.
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USA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Electron Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
机构:
Division of Science and Technology,Inner Mongolia Normal UniversityCollege of Physics and Electronic Information,Inner Mongolia Normal University,Inner Mongolia Key Laboratory for Physics and Chemistry of Functional Materials