On-chip cross talk noise model for deep-submicrometer ULSI interconnect

被引：0
|
作者：
Nakagawa, SO [1 ]
Sylvester, DM [1 ]
McBride, JG [1 ]
Oh, SY [1 ]
机构：
[1] Hewlett Packard Corp, Palo Alto, CA 94304 USA
来源：
HEWLETT-PACKARD JOURNAL | 1998年 / 49卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A Simple closed-form model for calculating cross talk noise on signal lines in deep-submicrometer interconnect systems has accuracy comparable to SP CE for an arbitrary ramp input rate. Interconnect resistance, interconnect capacitance. and driver resistance are ail taken into account. The model is suitable for rapid cross talk estimation and signal integrity verification.
引用
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页码：39 / 45
页数：7
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