The mature silicon technological platform is actively explored for spintronic applications. Metal silicides are an integral part of the Si technology used as interconnects, gate electrodes, and diffusion barriers; their epitaxial integration with Si results in premier contacts. Recent studies highlight the exceptional role of electronic discontinuities at interfaces in the spin-dependent transport properties. Here, we report a new type of Hall conductivity driven by sharp interfaces of Eu silicide, an antiferromagnetic metal, sandwiched between two insulators - Si and SiOx. Quasi ballistic transport probes spin-orbit coupling at the interfaces, in particular, charge-spin interconversion. Transverse magnetic field results in anomalous Hall effect signals of an unusual line shape. The interplay between opposite-sign signals from the two interfaces allows efficient control over the magnitude and sign of the overall effect. Selective engineering of interfaces singles out a particular spin signal. The two-channel nature of the effect and its high tunability offer new functional possibilities for future spintronic devices.
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Brookhaven Natl Lab, Upton, NY 11973 USABrookhaven Natl Lab, Upton, NY 11973 USA
Han, Myung-Geun
Marshall, Matthew S. J.
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Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA
Yale Univ, Ctr Res Interface Struct & Phenomena, New Haven, CT 06520 USABrookhaven Natl Lab, Upton, NY 11973 USA
Marshall, Matthew S. J.
Wu, Lijun
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Brookhaven Natl Lab, Upton, NY 11973 USABrookhaven Natl Lab, Upton, NY 11973 USA
Wu, Lijun
Schofield, Marvin A.
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Brookhaven Natl Lab, Upton, NY 11973 USABrookhaven Natl Lab, Upton, NY 11973 USA
Schofield, Marvin A.
Aoki, Toshihiro
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JEOL USA Inc, Peabody, MA 01960 USABrookhaven Natl Lab, Upton, NY 11973 USA
Aoki, Toshihiro
Twesten, Ray
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Gatan Inc, Pleasanton, CA 94588 USABrookhaven Natl Lab, Upton, NY 11973 USA
Twesten, Ray
Hoffman, Jason
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Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA
Yale Univ, Ctr Res Interface Struct & Phenomena, New Haven, CT 06520 USABrookhaven Natl Lab, Upton, NY 11973 USA
Hoffman, Jason
Walker, Frederick J.
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Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA
Yale Univ, Ctr Res Interface Struct & Phenomena, New Haven, CT 06520 USABrookhaven Natl Lab, Upton, NY 11973 USA
Walker, Frederick J.
Ahn, Charles H.
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Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA
Yale Univ, Ctr Res Interface Struct & Phenomena, New Haven, CT 06520 USABrookhaven Natl Lab, Upton, NY 11973 USA
Ahn, Charles H.
Zhu, Yimei
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Brookhaven Natl Lab, Upton, NY 11973 USABrookhaven Natl Lab, Upton, NY 11973 USA