Experimental evidence of the size effect in thin ferroelectric films

被引：77
|
作者：
Vendik, OG [1 ]
Zubko, SP
Ter-Martirosayn, LT
机构：
[1] Chalmers Univ Technol, Dept Microelect, S-41296 Gothenburg, Sweden
[2] Electrotech Univ, Dept Elect, St Petersburg 197376, Russia
[3] Electrotech Univ, Dept Phys, St Petersburg 197376, Russia
来源：
APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 01期
关键词：
D O I：
10.1063/1.121715
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The phenomenological model based on the Ginsburg-Devonshire equation has been applied to investigate the size effect in thin SrTiO3 and BaxSr1-xTiO3 films. The size effect is caused by two phenomena: spatial correlation of the polarization and boundary conditions for the ferroelectric polarization on electrodes. The experimental data obtained by different groups were used to investigate the boundary conditions. The most remarkable result was found for the SrRuO3/BaxSr1-xTiO3/SrRuO3 structure which is characterized by free boundary conditions for the ferroelectric polarization. Such boundary conditions provide the highest value of the effective dielectric constant of a dielectric layer in the sandwich structure. The strain dependence of the dielectric permittivity of SrTiO3 at finite temperatures was taken into account as well. (C) 1998 American Institute of Physics.
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收藏
页码：37 / 39
页数：3
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