Double-pass point diffraction interferometer

被引:13
|
作者
Kihm, Hagyong [1 ]
Lee, Yun-Woo [1 ]
机构
[1] Korea Res Inst Stand & Sci, Ctr Space Opt, Taejon 305340, South Korea
关键词
interferometers;
D O I
10.1088/0957-0233/21/10/105307
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We propose a new point diffraction interferometer for qualitative optical analysis. Point diffraction is made two times to generate interfering waves with a single pinholed polarizer. Diffraction from a pinholed polarizer makes reference and measurement waves with a double-pass configuration. A quarter-wave plate rotates their polarization angles after reciprocation. The interferogram between the diffracted-undiffracted measurement wave and the undiffracted-diffracted reference wave is vibration-insensitive due to a common-path configuration. We examined its capability by changing the pinhole size and divergence angle of the diffracted wave for test optics with various numerical apertures.
引用
收藏
页数:5
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