Rapid determination of colloidal crystal's structure by reflection spectrum

被引：10
|
作者：
Zhou, Hongwei [1 ,2 ]
Xu, Shenghua [1 ,2 ]
Sun, Zhiwei [1 ,2 ]
Du, Xuan [1 ,2 ]
Xie, Jingchang [1 ,2 ]
机构：
[1] Chinese Acad Sci, Inst Mech, Beijing 100190, Peoples R China
[2] Chinese Acad Sci, Inst Mech, Beijing 100190, Peoples R China
来源：
COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS | 2011年 / 375卷 / 1-3期
基金：
中国国家自然科学基金;
关键词：
Colloidal crystal; Crystal structure; Reflection spectrum; Static light scattering; ANGLE X-RAY; LIGHT-SCATTERING; SILICA SPHERES; PHASE-DIAGRAM; CRYSTALLIZATION; DISPERSIONS; TRANSITIONS; COEXISTENCE; ATTRACTION; NUCLEATION;
D O I：
10.1016/j.colsurfa.2010.11.051
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We prove that the reflection spectrum (RS), which was thought to be not able to determine the crystal structure, can be used to determine the colloidal crystal's structure with a rather fast sample rate. This method shows its superiority by comparing with conventional static light scattering (SLS) method. The result greatly extended the applicability of the reflection spectrum method, which has already been used in measuring lattice spacing and crystal size, etc. in the study of colloidal crystals. Therefore, it becomes possible for the reflection spectrum method to simultaneously and rapidly determine the crystal structure, lattice constant and crystal size, etc. of colloidal crystals, which is essential for deep understanding of phase behavior and crystallization kinetics. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码：50 / 54
页数：5
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