Analysis of plastic deformation with energy-dispersive X-ray diffraction: Application to deformation with a diamond anvil cell

The potential of energy-dispersive diffraction with a synchrotron source fr the analysis of plastic deformation is discussed. Adapting well-known relations from angle-dispersive diffraction for the effect of lattice defects on peak positions a,nd peak widths, it is shown that despite the low resolution of the present method, it is in principle possible to observe and analyze plastic deformation in special cases. As an example, the diamond anvil cell is demonstrated to be a useful tool for the in-situ investigation of plastic deformation by a strongly uniaxial stress field.