Development of electron beam ion source for nanoprocess using highly charged ions

被引:4
|
作者
Sakurai, M
Nakajima, F
Fukumoto, T
Nakamura, N
Ohtani, S
Mashiko, S
Sakaue, H
机构
[1] Kobe Univ, Dept Phys, Nada Ku, Kobe, Hyogo 6578501, Japan
[2] Univ Electrocommun, Inst Laser Sci, Chofu, Tokyo 1828585, Japan
[3] Natl Inst Informat & Commun Technol, Kobe, Hyogo 6512492, Japan
[4] Natl Inst Fus Sci, Toki 5095292, Japan
关键词
highly charged ions; electron beam ion source; nanoprocess;
D O I
10.1016/j.nimb.2005.03.236
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Highly charged ion is useful to produce nanostructure on various materials, and is key tool to realize single ion implantation technique. On such demands for the application to nanotechnology, we have designed an electron bean ion source. The design stresses on the volume of drift tubes where highly charged ions are confined and the efficiency of ion extraction from the drift tube through collector electrode in order to obtain intense ion beam as much as possible. The ion source uses a discrete superconducting magnet cooled by a closed-cycle refrigerator in order to reduce the running costs and to simplify the operating procedures. The electrodes of electron gun, drift tubes, and collector are enclosed in ultrahigh vacuum tube that is inserted into the bore of the magnet system. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:519 / 523
页数:5
相关论文
共 50 条
  • [21] Highly charged ions generated in a pinched electron beam
    Mücke, M
    Rao, R
    Becker, R
    Kleinod, M
    PHYSICA SCRIPTA, 2001, T92 : 188 - 190
  • [22] Collision Processes of Highly Charged Ions with Electrons Studied with an Electron Beam Ion Trap
    Nakamura, Nobuyuki
    Kavanagh, Anthony P.
    Watanabe, Hirofumi
    Sakaue, Hiroyuki A.
    Lie, Yueming
    Kato, Daiji
    Currell, Fred J.
    Tong, Xiao-Ming
    Watanabe, Tsutomu
    Ohtani, Shunsuke
    ATOMIC PROCESSES IN PLASMAS, 2009, 1161 : 96 - 96
  • [23] First investigations of a warm electron beam ion trap for the production of highly charged ions
    Ovsyannikov, V.P.
    Zschornack, G.
    Review of Scientific Instruments, 70 (06):
  • [24] Laser ion source torch for highly charged ions
    Demyanov, AV
    Sidorov, SV
    Avdeev, SA
    Jatcenko, BP
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02): : 1156 - 1157
  • [25] Photoionization of highly charged ions using an ECR ion source and undulator radiation
    Bizau, JM
    Esteva, JM
    Cubaynes, D
    Wuilleumier, FJ
    Blancard, C
    La Fontaine, AC
    Couillaud, C
    Lachkar, J
    Marmoret, R
    Rémond, C
    Bruneau, J
    Hitz, D
    Ludwig, P
    Delaunay, M
    PHYSICAL REVIEW LETTERS, 2000, 84 (03) : 435 - 438
  • [26] On the measurement of electron impact ionisation cross-sections for highly charged ions using an electron beam ion trap (EBIT)
    Sokell, E
    Currell, FJ
    Shimizu, H
    Ohtani, S
    PHYSICA SCRIPTA, 1999, T80B : 289 - 291
  • [27] Development and application of highly charged ion source
    Sakurai, Makoto
    Onishi, Hiroyuki
    Asakura, Ken
    Tona, Masahide
    Watanabe, Hirofumi
    Nakamura, Nobuyuki
    Ohtani, Shunsuke
    Terui, Toshifumi
    Mashiko, Shinro
    Sakaue, Hiroyuki A.
    VACUUM, 2009, 84 (05) : 530 - 533
  • [28] The production of high-duty-cycle, high-yield beams of highly charged ions with an electron beam ion source
    Stockli, MP
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (03): : 892 - 894
  • [29] PHOBIS, A PHOTON-BEAM ION-SOURCE FOR PRODUCTION OF HIGHLY-CHARGED IONS
    JONES, KW
    JOHNSON, BM
    MERON, M
    PHYSICS LETTERS A, 1983, 97 (09) : 377 - 380
  • [30] Production of a highly charged uranium ion beam with RIKEN superconducting electron cyclotron resonance ion source
    Higurashi, Y.
    Ohnishi, J.
    Nakagawa, T.
    Haba, H.
    Tamura, M.
    Aihara, T.
    Fujimaki, M.
    Komiyama, M.
    Uchiyama, A.
    Kamigaito, O.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (02):