Extreme high vacuum field emission microscope for study on the inherent fluctuation of field emission

被引：1
|
作者：
Cho, B.
Itagaki, T.
Ishikawa, T.
Rokuta, E.
Oshima, C.
机构：
[1] Waseda Univ, Kagami Mem Lab Mat Sci & Technol, Shinjuku Ku, Tokyo 1690051, Japan
[2] Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 169, Japan
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2007年 / 25卷 / 04期
关键词：
D O I：
10.1116/1.2757182
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An extreme high vacuum field emission microscope (XHV FEM) was constructed for the study of inherent fluctuations of field emission (FE) current. The damping and fluctuation behaviors of FE current from clean W(l 11) tips at 90 K were observed using the XHV FEM. Exposure to XHV of 7.5 x 10(-10) Pa continued to damp FE current for more than 2000 min. The fluctuation (similar to 0.01 %) of FE current (1 nA) for the clean W(111) tips was comparable to the corresponding shot noise fluctuation (0.005%), demonstrating the suitability of the XHV FEM for the inherent fluctuation study of the FE process. After saturating the tip surface with hydrogen, the FE current showed fluctuations of <0.1%. (C) 2007 American Vacuum Society.
引用
收藏
页码：1420 / 1423
页数：4
相关论文
共 50 条
  • [11] A STUDY OF SRO ON MO BY USE OF THE FIELD EMISSION MICROSCOPE
    KRUSE, PW
    COOMES, EA
    PHYSICAL REVIEW, 1954, 93 (04): : 929 - 930
  • [12] A SCANNING FIELD-EMISSION MICROSCOPE
    SENDECKI, S
    BARWINSKI, B
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1995, 6 (03) : 306 - 309
  • [13] ELECTRON TRAJECTORIES IN A FIELD EMISSION MICROSCOPE
    RUSSELL, AM
    JOURNAL OF APPLIED PHYSICS, 1962, 33 (03) : 970 - &
  • [14] A THEORETICAL STUDY OF FIELD EMISSION INITIATED VACUUM BREAKDOWN
    CHATTERTON, PA
    PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1966, 88 (559P): : 231 - +
  • [15] Field-emission laboratory - a field electron emission spectrometer combined with a field ion/electron microscope
    Inst Elektrofiziki, Ekaterinburg, Russia
    Prib Tekh Eksp, 4 (126-134):
  • [16] Charge contrast imaging of nonconductive samples in the high-vacuum field emission scanning electron microscope
    Ji, Yuan
    Wang, Li
    Qu, Xueling
    Fu, Jingyong
    Zhang, Yinqi
    Xu, Xuedong
    Zhong, Taoxing
    Wei, Bin
    Liu, Cuixiu
    SCANNING, 2007, 29 (05) : 230 - 237
  • [17] Emission stability of a field emitter array observed by an emission microscope
    Miyamoto, N
    Adachi, H
    Nakane, H
    Yamane, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (01): : 436 - 439
  • [18] W(310) cold-field emission characteristics reflecting the vacuum states of an extreme high vacuum electron gun
    Cho, Boklae
    Shigeru, Kokubo
    Oshima, Chuhei
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (01):
  • [19] Complementary Vacuum Field Emission Transistor
    Bhattacharya, Ranajoy
    Han, Jin-Woo
    Browning, Jim
    Meyyappan, M.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (10) : 5244 - 5249
  • [20] Nanodiamond vacuum field emission microtriode
    Hsu, Shao-Hua
    Kang, Weng Poo
    Raina, Supil
    Howell, Mick
    Huang, Jin-Hua
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2017, 35 (03):
12345