Use TRIZ in reverse to analyze failures

被引：0
|
作者：
Hipple, J [1 ]
机构：
[1] TRIz, Tampa, FL 33647 USA
来源：
CHEMICAL ENGINEERING PROGRESS | 2005年 / 101卷 / 05期
关键词：
D O I：
暂无
中图分类号：
TQ [化学工业];
学科分类号：
0817 ;
摘要：
Asking "how could I make this fail?" can help you identify potential problems that you might not otherwise have considered.
引用
收藏
页码：48 / 51
页数：4
相关论文
共 50 条
  • [21] Adapted Use of the TRIZ System Operator
    Fiorineschi, Lorenzo
    Frillici, Francesco Saverio
    Rotini, Federico
    Conti, Leonardo
    Rossi, Giuseppe
    APPLIED SCIENCES-BASEL, 2021, 11 (14):
  • [22] Analyze-NOW - An environment for collection and analysis of failures in a network of workstations
    Thakur, A
    Iyer, RK
    SEVENTH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING, PROCEEDINGS, 1996, : 14 - 23
  • [23] Assessing Direct Monitoring Techniques to Analyze Failures of Critical Industrial Systems
    Cinque, Marcello
    Cotroneo, Domenico
    Della Corte, Raffaele
    Pecchia, Antonio
    2014 IEEE 25TH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING (ISSRE), 2014, : 212 - 222
  • [24] Analyze-NOW - An environment for collection & analysis of failures in a network of workstations
    Thakur, A
    Iyer, RK
    IEEE TRANSACTIONS ON RELIABILITY, 1996, 45 (04) : 561 - 570
  • [25] Use logic diagrams to analyze
    Pires, TT
    Duarte, D
    CHEMICAL ENGINEERING PROGRESS, 2005, 101 (06) : 28 - 32
  • [26] THE USE OF HYBRIDOMAS TO ANALYZE AUTOIMMUNITY
    ISENBERG, DA
    SHOENFELD, Y
    SCHWARTZ, RS
    BRITISH MEDICAL BULLETIN, 1984, 40 (03) : 262 - 266
  • [27] Anomalous ESD failures in NLDMOS during reverse recovery
    Hirano, Tetsuro
    Hase, Mitsuo
    Ogura, Takashi
    Tanaka, Shuji
    Fujiwara, Shuji
    ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS 2010, 2010,
  • [28] USE VOICEPRINTS TO ANALYZE SPEECH
    CIARCIA, S
    BYTE, 1982, 7 (03): : 50 - &
  • [29] Teacher Education to Analyze and Design Systems through Reverse Engineering
    Verner, Igor
    Greenholts, Moshe
    EDUCATIONAL ROBOTICS IN THE MAKERS ERA, 2017, 560 : 122 - 132
  • [30] A Framework to Model and Analyze Electric Grid Cascading Failures to Identify Critical Nodes
    Pierre, Brian J.
    Krofcheck, Daniel
    Munoz-Ramos, Karina
    Arguello, Bryan
    2022 17TH INTERNATIONAL CONFERENCE ON PROBABILISTIC METHODS APPLIED TO POWER SYSTEMS (PMAPS), 2022,
12345