Photoelectric conversion characteristics of c-Se-based thin-film photodiodes in imaging device

被引:3
|
作者
Imura, S. [1 ]
Kikuchi, K. [1 ]
Miyakawa, K. [1 ]
Ohtake, H. [1 ]
Kubota, M. [1 ]
机构
[1] NHK Sci & Technol Res Labs, Setagaya Ku, Tokyo 1578510, Japan
关键词
BETA-GA2O3;
D O I
10.1088/1742-6596/619/1/012008
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Herein, we report the use of high-efficiency crystalline-selenium-based (c-Se-based) thin-film heterojunction photodiodes in imaging devices. As a novel experiment, we use an image pickup tube with a photoelectric conversion layer consisting of n-gallium oxide (Ga2O3)/p-c-Se heterojunction photodiodes to obtain high-resolution images at a relatively low applied voltage. We reduce the thickness of the Ga2O3 layer to expand the depletion layer into the c-Se layer at a lower applied voltage. In addition, Sn-doping of the Ga2O3 layer effectively increases the carrier concentration, thereby allowing the photodiode to operate at lower voltage.
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页数:3
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