In-situ Synthesis of PtSn/C Fuel Cell Nanocatalysts in an Aberration-Corrected STEM/TEM

被引:1
|
作者
Liu, Jingyue [1 ,2 ]
Braddock-Wilking, Janet [1 ,2 ]
Allard, Lawrence F. [3 ]
机构
[1] Univ Missouri, Ctr Nanosci, St Louis, MO 63121 USA
[2] Univ Missouri, Dept Chem & Biochem, St Louis, MO 63121 USA
[3] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA
关键词
D O I
10.1017/S1431927609098079
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
[No abstract available]
引用
收藏
页码:688 / 689
页数:2
相关论文
共 50 条
  • [21] Atomic-scale imaging of the defect dynamics in ceria nanowires under heating by in situ aberration-corrected TEM
    Xiaomin Li
    Kaihui Liu
    Wenlong Wang
    Xuedong Bai
    Science China Chemistry, 2019, 62 : 1704 - 1709
  • [22] Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM
    Inada, Hiromi
    Wu, Lijun
    Wall, Joe
    Su, Dong
    Zhu, Yimei
    JOURNAL OF ELECTRON MICROSCOPY, 2009, 58 (03): : 111 - 122
  • [23] Icosahedral Face-Centered Cubic Fe Nanoparticles: Facile Synthesis and Characterization with Aberration-Corrected TEM
    Ling, Tao
    Xie, Lin
    Zhu, Jing
    Yu, Huimin
    Ye, Hengqiang
    Yu, Rong
    Cheng, Zhiying
    Liu, Li
    Liu, Li
    Yang, Guangwen
    Cheng, Zhida
    Wang, Yujia
    Ma, Xiuliang
    NANO LETTERS, 2009, 9 (04) : 1572 - 1576
  • [24] Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory
    Blom, Douglas A.
    Allard, Lawrence F.
    Mishina, Satoshi
    O'Keefe, Michael A.
    MICROSCOPY AND MICROANALYSIS, 2006, 12 (06) : 483 - 491
  • [25] An Optimization Study of PtSn/C Nanocatalysts Prepared by Microwave-assisted Heating and Their Application in Direct Ethanol Fuel Cell: A Comparative Study of PtSn/C Nanocatalysts
    Almeida, T. S.
    Palma, L. M.
    Leonello, P. H.
    KoKoh, K. B.
    Andrade, A. R.
    POLYMER ELECTROLYTE FUEL CELLS 11, 2011, 41 (01): : 1271 - 1278
  • [26] Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM
    Xin, Huolin L.
    Muller, David A.
    JOURNAL OF ELECTRON MICROSCOPY, 2009, 58 (03): : 157 - 165
  • [27] Advanced Aberration-corrected STEM Techniques for Atomic Imaging of Zeolites-confined Single Molecules: From Ex situ to In situ
    Wang, Guowei
    Xiong, Hao
    Wei, Fei
    Chen, Xiao
    CHEMICAL RESEARCH IN CHINESE UNIVERSITIES, 2025, : 196 - 210
  • [28] Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University
    Jiang, Hua
    Ruokolainen, Janne
    Young, Neil
    Oikawa, Tetsuo
    Nasibulin, Albert G.
    Kirkland, Angus
    Kauppinen, Esko I.
    MICRON, 2012, 43 (04) : 545 - 550
  • [29] Characterization of thickness, elemental distribution and band-gap properties in AlGaN/GaN quantum wells by aberration-corrected TEM/STEM
    Amari, H.
    Ross, I. M.
    Wang, T.
    Walther, T.
    ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011), 2012, 371
  • [30] Direct observation of a stacking fault in Si1-xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM
    Yamasaki, J
    Kawai, T
    Tanaka, N
    JOURNAL OF ELECTRON MICROSCOPY, 2004, 53 (02): : 129 - 135