Novel Characterization of Photodiode Intermodulation Distortion

被引：0
|
作者：
Hutchinson, M. N. [1 ]
Frigo, N. J. [2 ]
Peasant, J. R. [3 ]
机构：
[1] US Naval Res Lab, Washington, DC 20375 USA
[2] US Naval Acad, Annapolis, MD 21402 USA
[3] Duke Univ, Durham, NC 27708 USA
来源：
2016 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2016年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel method is presented to characterize photodiode intermodulation distortion (IMD) as a function of output frequency. We find that for a given bias voltage and photocurrent, the IMDs can fall along a single curve.
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页数：2
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