Measuring technological performance of assignees using trace metrics in three fields

被引：5
|
作者：
Huang, Mu-Hsuan [1 ]
Chen, Dar-Zen [2 ]
Shen, Danqi [1 ]
Wang, Mona S. [3 ]
Ye, Fred Y. [4 ]
机构：
[1] Natl Taiwan Univ, Dept Lib & Informat Sci, Taipei 10764, Taiwan
[2] Natl Taiwan Univ, Dept Mech Engn, Inst Ind Engn, Taipei 10764, Taiwan
[3] Zhejiang Univ, Dept Informat Resource Management, Hangzhou 310003, Zhejiang, Peoples R China
[4] Nanjing Univ, Sch Informat Management, Nanjing 210008, Jiangsu, Peoples R China
来源：
SCIENTOMETRICS | 2015年 / 104卷 / 01期
关键词：
Academic trace; Assignee trace; Patent trace; h-Index; CII; PATENT CITATIONS; H-INDEX; INDICATORS; STRENGTH; EVALUATE; CORE; TAIL;
D O I：
10.1007/s11192-015-1604-8
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
The study establishes three synthetic indicators derived from academic traces-assignee traces T-1, T-2 and ST-and investigates their application in evaluating technological performance of assignees. Patent data for the top 100 assignees in three fields, "Computer Hardware & Software", "Motors, Engines & Parts", and "Drugs & Medical", were retrieved from USPTO for further analysis. The results reveal that traces are indeed valid and useful indicators for measuring technological performance and providing detailed technical information about assignees and the industry. In addition, we investigate the relationship between traces and three other indicators: patent citation counts, Current Impact Index and patent h-index. In comparison with the three other indicators, traces demonstrate unique advantages and can be a good complement to patent citation analysis.
引用
收藏
页码：61 / 86
页数：26
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